MC/DC based estimation and detection of residual faults in PLC logic networks

نویسنده

  • Peter G Bishop
چکیده

A logic coverage measure related to MC/DC testing is used to estimate residual faults. The residual fault prediction method is evaluated on an industrial PLC logic example. A randomized form of MC/DC testing is used to maximize coverage growth and fault detection efficiency.

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تاریخ انتشار 2003